By Krishnendu Chakrabarty, Vikram Iyengar, Anshuman Chandra (auth.)
ISBN-10: 1461354005
ISBN-13: 9781461354000
ISBN-10: 1461511135
ISBN-13: 9781461511137
Test source Partitioning for System-on-a-Chip is ready try source partitioning and optimization innovations for plug-and-play system-on-a-chip (SOC) attempt automation. Plug-and-play refers back to the paradigm during which core-to-core interfaces in addition to core-to-SOC good judgment interfaces are standardized, such that cores will be simply plugged into "virtual sockets" at the SOC layout, and center checks could be plugged into the SOC in the course of attempt with out titanic attempt at the a part of the method integrator. The objective of the ebook is to put try out source partitioning within the context of SOC try out automation, in addition to to generate curiosity and inspire examine in this vital topic.
SOC built-in circuits composed of embedded cores at the moment are standard. however, There stay numerous roadblocks to fast and effective process integration. attempt improvement is noticeable as an enormous bottleneck in SOC layout, and try out demanding situations are an enormous contributor to the widening hole among layout power and production ability. checking out SOCs is mainly difficult within the absence of standardized try constructions, attempt automation instruments, and try out protocols.
Test source Partitioning for System-on-a-Chip responds to a urgent want for a based technique for SOC try automation. It provides new suggestions for the partitioning and optimization of the 3 significant SOC try out assets: attempt undefined, checking out time and attempt information volume.
Test source Partitioning for System-on-a-Chip paves the best way for a strong built-in framework to automate the attempt circulation for plenty of cores in an SOC in a plug-and-play style. The framework awarded permits the method integrator to lessen attempt rate and meet brief time-to-market standards.
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Additional resources for Test Resource Partitioning for System-on-a-Chip
Sample text
Let 8ij be an "indicator" 0-1 variable defined as follows: 8.. - {I,0, otherwise if > Wj 'J
J Finally, we present experimental results on solving optimization problems P4 and P5. We consider SI and S2 with two test buses (1 and 2), and model the situation where the first test bus can fork into at most two branches (la and Ib). The objective of this set of experiments was twofold: (i) demonstrate that P4 (P5) provides lower testing time than PI (P2), and (ii) show that even non-optimal solutions for P5 provide lower testing time than P2. 2 to illustrate PI. For this example, WI = 32, W2 = 16, and an optimal testing time of 411884 cycles was obtained using PI.
If Core i is assigned to Bus j, the amount of test data serialization at the 1I0s of Core i is related to the difference between Core i's test width ¢i and the width W j of Bus j, where ¢i = max{ni, mi}. Let ti be the testing time in cycles required by Core i when no de-serialization is necessary. For combinational cores, ti is equal to the number oftest patterns Pi. However, for cores with internal scan, ti = (Pi + 1) hi Si 1+ Pi, where Core i contains Ii flip-flops and Si internal scan chains.
Test Resource Partitioning for System-on-a-Chip by Krishnendu Chakrabarty, Vikram Iyengar, Anshuman Chandra (auth.)
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