By Gordon Roberts, Friedrich Taenzler, Mark Burns
ISBN-10: 0195140168
ISBN-13: 9780195140163
Built-in circuits incorporating either electronic and analog services became more and more well-known within the semiconductor undefined. Mixed-signal IC attempt and dimension has grown right into a hugely really expert box of electric engineering. besides the fact that, try engineering remains to be a comparatively unknown occupation in comparison to IC layout engineering.
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Extra resources for An Introduction to Mixed-Signal Test and Measurement
Example text
It is not necessary to measurethe exact countdownperiod in secondsand fractionsof a second. The digital countercircuit either dividesby one million or it doesnot. This type of digital logic verificationis knownasafunctionalpattern test. The only way the I-s period of time could be in error is if the divider circuits are not functional or if the I-MHz external reference clock is not set to the correct frequency. An incorrect external frequency setting does not need to be tested during IC production, since it is not a function of device performance.
For example, an amplifier's absolute gain may be specified from 0 to 10kHz. If the test engineer plans to test absolute gain at only three frequencies, then the test plan should explain why those frequencies were chosen. Was it an arbitrary choice, or does it relate to expected weaknessesin the design? It should also answer other questions: What was the input signal level? What typical level is expected from the output of the device? Are other tests like signal-to-noise ratio tested at the same time as absolute gain?
The test engineer can debug test programs from the workstation using a variety of software tools from the ATE vendor. Manufacturing personnel can also use the workstation to control the day-to-day operation of the tester as it tests devices in production. The mainframe contains power supplies, measurement instruments, and one or more computers that control the instruments as the test program is executed. The mainframe may also contain a manipulator to position the test head precisely. It may also contain a refrigeration unit to provide cooled liquid to regulate the temperature of the test head electronics.
An Introduction to Mixed-Signal Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns
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