By M. M. Blouke, T. Woody, T. Dosluoglu, S. T. Elliott, J. R. Janesick, R. Reed, R. Stover (auth.), James W. Beletic, Paola Amico (eds.)
ISBN-10: 9401062145
ISBN-13: 9789401062145
ISBN-10: 9401152624
ISBN-13: 9789401152624
The Workshop "Optical Detectors for Astronomy" was once held in the course of October 8-10, 1996 on the headquarters of the ecu Southern Observatory in Garching, Germany. This was once the 3rd assembly of its sort, past conferences being held in 1991 and 1993, yet this can be the 1st ESO "CCD Workshop" that has released court cases. many of the top brands and significant astronomical observatories have been represented, with the 117 attendees coming jointly from 14 assorted international locations that spanned each continent on the earth. the incentive for the ESO CCD Workshop sequence is the construction of casual and open venue of data trade approximately astronomical CCD detectors and structures. Judging from the response and suggestions of the members, the 1996 workshop was once as winning because the prior variants, that is a credits to all who attended. The Workshop used to be equipped as a mix of invited talks, oral displays, poster classes and roundtable discussions, the latter used to foster a unfastened trade of rules between contributors. those technical classes have been complemented by way of a gap reception and a congenial night in downtown Munich, which incorporated a jogging journey of the historical quarter by means of dinner on the recognized Franziskaner brewery and an after dinner speak through Walter Kosonocky, who reviewed the background of CCD technology.
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Additional resources for Optical Detectors for Astronomy: Proceedings of an ESO CCD Workshop held in Garching, Germany, October 8–10, 1996
Example text
Restoration activated by the transfer of charge into the read-out register via an internal connection to the last image section clock phase. It may be noted that the connections to the circuit are identical to those of a (OUTPUT CIRCUIT NOISE I single stage type, the only difference 16 II being a standing ~ I. n~ hl~ • I 14 current «1 mA) [ reque cy +:1width at wi el' r p e-spn pin now flowing in the en 12 , E I "substrate en 10 c connection. There I I o / is no light emission t 8 / W // to cause generation 6 of spurious charge.
1 •• •• standardize the thickness -I'. -551 - 7 .... ' of each package and to - lil4 make the base of the ,. package parallel with the - , • • 45 - •. 45 surface of the CCD. UNPACKAGEO CCO Invar has the best e... u ttl silicon expansion of -t: : Ut coefficient with :nl -ill. temperature IS such that the match is only perfect at -70°C with the result that the assembly bends in one direction as the CCO IN PACKAGE temperature is reduced to Figure 10 70°C and begins to relax back below -70°C. A good fit has been obtained between measurements and a simple model and the model has allowed us to predict the effect of altering the Invar thickness (Fig 12).
The latter offers an interesting capability of performing tip-tilt correction electronically, and results of field tests with this device are described in another paper in these proceedings [3]. All of the devices described here are fabricated at the Microelectronics Laboratory at Lincoln Laboratory and features 750 m2 of class 10 and 900 m2 of class 100 clean-room space. A significant recent development in this facility was the conversion from 100-mm to 150-mm wafers in October 1996. This conversion included the acquisition of a new full-wafer scanner with l-Ilm resolution specifically for largearea CCDs on the larger wafers.
Optical Detectors for Astronomy: Proceedings of an ESO CCD Workshop held in Garching, Germany, October 8–10, 1996 by M. M. Blouke, T. Woody, T. Dosluoglu, S. T. Elliott, J. R. Janesick, R. Reed, R. Stover (auth.), James W. Beletic, Paola Amico (eds.)
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