By Gordon Roberts, Friedrich Taenzler, Mark Burns
ISBN-10: 0199796211
ISBN-13: 9780199796212
ISBN-10: 1613449488
ISBN-13: 9781613449486
With the proliferation of complicated semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, brand new engineer needs to be fluent in all 4 circuit kinds. Written for complex undergraduate and graduate-level scholars, in addition to engineering execs, this booklet encompasses analog, mixed-signal and radio-frequency circuits exams, with many appropriate business examples. The textual content assumes an outstanding history in analog and electronic circuits and a operating wisdom of pcs and desktop programming. It contains examples and illustrations, that includes state of the art commercial know-how, to complement and liven up the textual content. The ebook additionally introduces large-scale mixed-signal circuit and person circuit assessments, discusses the value-added merits of mixed-signal IC trying out to a manufacturer's product, and obviously defines the function of the attempt engineer.
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Additional resources for Introduction to Mixed-Signal IC Test and Measurement
Example text
Thus there are typically three drive states (HI, LO, and HIZ) and five compare states (HI, LO, and MID, VALID, and MASK). The usefulness of the valid comparison is not immediately obvious. If we want to test for valid VOH and VOL voltages from the output of a nondeterministic circuit such as an ADC, we cannot set the tester to expect HI or LO. This is because electrical noise in the ADC and tester will produce somewhat unpredictable results at the ADC output. However, we can set the tester to expect valid logic levels during the appropriate digital vectors without specifying whether the ADC should produce a HI or a LO.
Defects such as these are the reason each semiconductor device must be tested before it can be shipped to the customer. It has been said that production testing adds no value to the final product. Testing is an expensive process that drives up the cost of integrated circuits without adding any new functionality. Testing cannot change the quality of the individual ICs; it can only measure quality if it already exists. However, semiconductor companies would not spend money to test products if the testing process did not add value.
5. D. A. Johns and K. Martin, Analog Integrated Circuit Design, John Wiley & Sons, New York, 1996, ISBN 0471144487. CHAPTER 2 Tester Hardware T his chapter explores the architecture of a mixed-signal ATE tester. While we do not focus on any particular ATE from any specific vendor, our intent here is to give a general overview of the common instruments found in such testers. This will include a discussion on DC sources and meters, waveform digitizers, arbitrary waveform generators, an RF measurement subsystem, and digital pattern generators with sources and capture functionality.
Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns
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